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EIT-EIS-566-V-7

Robust Digital Systems

Thursday11:45 - 13:15Room: 13-222

Start:  Thu, 2018-04-12
2 hours of lecture (3 ECTS credits)

News

  • Information about the exam, including exam dates, is published on the OpenOLAT web page of this course.

  • There will be embedded Erasmus Mundus Distinguished Lectures by Prof. Dr. Basel Halak from Southampton University, UK. Dr. Halak will teach 3 lectures:

    • Thu, 2018-06-14 (regular time slot, 13-222 as usual)
    • Fri, 2018-06-15, 14:00-15:30, 13-305
    • Thu, 2018-06-21 (regular time slot, 13-222 as usual)


    (See more information below.)

Language

This course is taught in English.

Content

Modern technology relies more and more on computing systems, impacting all aspects of human life. The complexity of these systems is constantly growing and so is their vulnerability against design errors, manufacturing defects and faults occurring during operation. Additional challenges result from latest manufacturing technologies which are inherently more susceptible to process variations, leading to unreliable circuit devices. This lecture discusses techniques to make digital systems robust against such faults and errors. 

Topics:

  1. Metrics of fault tolerance (reliability, availability, failure rate, MTTF, Weibull distribution, system reliability analysis)

  1. Structural Redundancy (triple-modular redundancy, N-modular redundancy, dynamic redundancy, hybrid schemes)

  1. Information Redundancy (codes and their properties, error detection and correction, parity codes, Hamming code, Hsiao code, checksum codes, cyclic codes, AN codes, residue codes)

  1. CMOS Failures(overview of failure causes in CMOS circuits: manufacturing defects, process variations, aging effects, soft errors)

  1. Fault Models (abstraction levels of fault models, transistor-level fault models, gate-level models, stuck-at faults, delay faults, bridging faults)

  1. Fault Simulation and Test Generation (fault simulation applications and algorithms, random test generation, structural ATPG, SAT-based ATPG, sequential test generation)

  1. Design for Testability (scan design, Built-in self test (BIST), offline BIST, online BIST)

  1. Hardware Redundancy Techniques (circuit-level resilience techniques (BISER, Razor), concurrent error detection, self-checking circuits)

  1. Software-based Resilience (checkpointing & recovery, software-based concurrent error detection)


Erasmus Mundus Distinguished Lecture

This year the course is complemented by three lectures given by Prof. Dr. Basel Halak from the University of Southampton, on the subject of Hardware Security.

DateTimePlace
Thu, 2018-06-1411:45 – 13:1513-222
Fri, 2018-06-1514:00 – 15:3013-305
Thu, 2018-06-2111:45 – 13:1513-222

The lectures will cover the following topics:

  • Secure Hardware: Motivation, Standards and Design Principles
  • Physically Unclonable Functions; Design Principles and Security Applications
  • Hardware Trojans: Causes and Countermeasure

Dr Basel Halak is the director of the Embedded Systems Master program at Southampton University, he has written over 60 conference and journal papers, and authored two books. He received his PhD degree in Microelectronics System Design from Newcastle University. He was then awarded a knowledge transfer fellowship to develop secure and energy efficient design for portable health care monitoring systems. He is a member of the Sustainable Electronics research group, as well as, Cyber Security group at Electronics and Computer Science School (ECS). His background is on the design and implementation of microelectronics systems, with special focus on reliability and security.

Downloads

Downloadable material is provided using OpenOLAT. Access information for the course is given in class.

Link to the course:

https://olat.vcrp.de/url/RepositoryEntry/2038431972