Robust Digital Systems
|Thursday||11:45 - 13:15||Room: 13-222|
Start: Thu, 2017-04-20
2 hours of lecture (3 ECTS credits)
- No lecture on Thu, 2017-06-15 (holiday).
- Erasmus Mundus Distinguished Lectures by Prof. Mihails Maniatakos, New York University. (See below)
- Exam dates have been fixed. See below for more information.
This course is taught in English.
Modern technology relies more and more on computing systems, impacting all aspects of human life. The complexity of these systems is constantly growing and so is their vulnerability against design errors, manufacturing defects and faults occurring during operation. Additional challenges result from latest manufacturing technologies which are inherently more susceptible to process variations, leading to unreliable circuit devices. This lecture discusses techniques to make digital systems robust against such faults and errors.
Metrics of fault tolerance (reliability, availability, failure rate, MTTF, Weibull distribution, system reliability analysis)
Structural Redundancy (triple-modular redundancy, N-modular redundancy, dynamic redundancy, hybrid schemes)
Information Redundancy (codes and their properties, error detection and correction, parity codes, Hamming code, Hsiao code, checksum codes, cyclic codes, AN codes, residue codes)
CMOS Failures(overview of failure causes in CMOS circuits: manufacturing defects, process variations, aging effects, soft errors)
Fault Models (abstraction levels of fault models, transistor-level fault models, gate-level models, stuck-at faults, delay faults, bridging faults)
Fault Simulation and Test Generation (fault simulation applications and algorithms, random test generation, structural ATPG, SAT-based ATPG, sequential test generation)
Design for Testability (scan design, Built-in self test (BIST), offline BIST, online BIST)
Hardware Redundancy Techniques (circuit-level resilience techniques (BISER, Razor), concurrent error detection, self-checking circuits)
Software-based Resilience (checkpointing & recovery, software-based concurrent error detection)
Erasmus Mundus Distinguished Lecture
This year the course is complemented by four lectures given by Prof. Mihalis Maniatakos, on the subject of Embedded Systems Security, with a focus on critical infrastructures.
Mihalis Maniatakos is an Assistant Professor of ECE at NYU Abu Dhabi and a Research Assistant Professor at the NYU Tandon School of Engineering. He is the Director of the MoMA Laboratory (nyuad.nyu.edu/momalab). He received his Ph.D. in 2012 from the Electrical Engineering department at Yale University. His research interests, funded by industry partners and the US government, include robust microprocessor architectures, privacy-preserving computation, as well as industrial control systems security. He has authored several publications in IEEE transactions and conferences, holds patents on privacy-preserving data processing, and serves in the technical program committee for various conferences. Michail is currently the faculty lead for the Embedded Security challenge held yearly at various NYU global sites.
More information about him can be found at his web page.
Some information about the exam:
- The exam is an oral exam.
- Exam dates will be published on this web page.
- You must have registered with the authorities responsible for your study course/program (Abteilung für Prüfungsangelegenheiten) in order to be able to take the exam.
- Appointments for exams must be made online. For instructions download [PDF].
- After online registration, you also need to have your student ID card verified with our secretary, Carmen Vicente-Fess (office hours: Mo-Fr 10:00h - 13:00h).
(In case you have already done this in an earlier semester for a different exam and your login still works you don't have to go through the registration procedure again. Your email address needs to be from the rhrk.uni-kl.de domain.)
- Please note: the number of available time slots on each oral exam date is limited. If all time slots on a particular day are taken the online registration system will not allow you to select that day and you will have to make a different choice.
- Wed, 2017-08-02
- Wed, 2017-10-11
Access information for the course material is given in class.
(slides per page)
|0 -||Organisation||(1) (2) (4)|
|1 -||Introduction||(1) (2) (4)|
|2 -||Metrics of Dependability||(1) (2) (4)|
|3 -||Structural Redundancy||(1) (2) (4)|
|4 -||Information Redundancy||(1) (2) (4)|
|5 -||CMOS Failures||(1) (2) (4)|
|6 -||Fault Models||(1) (2) (4)|
|7 -||Fault Simulation and Test Generation||(1) (2) (4)|
|8 -||Design For Testability||(1) (2) (4)|
|9 -||Hardware Redundancy||(1) (2) (4)|
|10 -||Software-Based Resilience||(1) (2) (4)|